The Works Of Archimedes

Author: Archimedes
Publisher: Courier Corporation
ISBN: 9780486154398
Size: 11.14 MB
Format: PDF
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Complete works of ancient geometer feature such topics as the famous problems of the ratio of the areas of a cylinder and an inscribed sphere; the properties of conoids, spheroids, and spirals; more.

A Manual Of Greek Mathematics

Author: Sir Thomas L. Heath
Publisher: Courier Corporation
ISBN: 9780486432311
Size: 15.87 MB
Format: PDF, ePub, Docs
View: 50

Originally published: Oxford: Clarendon Press, 1931; previously published by Dover Publications in 1963.

Principles Of Topology

Author: Fred H. Croom
Publisher: Courier Dover Publications
ISBN: 9780486801544
Size: 15.59 MB
Format: PDF, Docs
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Designed for a one-semester introductory course, this text covers metric spaces, general topological spaces, continuity, topological equivalence, basis and subbasis, connectedness and compactness, separation properties, metrization, subspaces, product spaces, and quotient spaces. 1989 edition.

Elements Of The Theory Of Functions

Author: Konrad Knopp
Publisher: Courier Dover Publications
ISBN: 9780486165608
Size: 19.22 MB
Format: PDF, Mobi
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Well-known book provides a clear, concise review of complex numbers and their geometric representation; linear functions and circular transformations; sets, sequences, and power series; analytic functions and conformal mapping; and elementary functions. 1952 edition.

Fundamentals Of The Theory Of Plasticity

Author: L. M. Kachanov
Publisher: Courier Corporation
ISBN: 9780486150826
Size: 19.97 MB
Format: PDF, ePub, Mobi
View: 78

Intended for use by advanced engineering students and professionals, this volume focuses on plastic deformation of metals at normal temperatures, as applied to strength of machines and structures. 1971 edition.

A User S Guide To Ellipsometry

Author: Harland G. Tompkins
Publisher: Courier Corporation
ISBN: 9780486450285
Size: 15.97 MB
Format: PDF, ePub
View: 19

This text on optics for graduate students explains how to determine material properties and parameters for inaccessible substrates and unknown films as well as how to measure extremely thin films. Its 14 case studies illustrate concepts and reinforce applications of ellipsometry — particularly in relation to the semiconductor industry and to studies involving corrosion and oxide growth. A User's Guide to Ellipsometry will enable readers to move beyond limited turn-key applications of ellipsometers. In addition to its comprehensive discussions of the measurement of film thickness and optical constants in film, it also considers the trajectories of the ellipsometric parameters Del and Psi and how changes in materials affect parameters. This volume also addresses the use of polysilicon, a material commonly employed in the microelectronics industry, and the effects of substrate roughness. Three appendices provide helpful references.